Characterization Lab
- X-Ray Diffraction with (Small Angle Scattering &polycrystalline)
- Atomic Force Microscopy (EFM, MFM, FMM, Nano Indentor & Lithograpgy tool)
- UV-Vis spectroscopy & DRS
- Particle Size Analysis
- Zeta potential Analysis
- ATR-FTIR spectroscopy
- Electrochemical Workstation
To access our Characteristation facilities contact details
email: nanofacilities@srec.ac.inĀ
Phone no. 0422-2461588 extn:395
Characterization Charge Details